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LEED crystallographic analysis for the Rh(111)-(root 7x root 7)R19.1 degrees-P surface structure

TitleLEED crystallographic analysis for the Rh(111)-(root 7x root 7)R19.1 degrees-P surface structure
Publication TypeJournal Article
Year of Publication1997
AuthorsLiu, W, Wong, KC, Mitchell, KAR
JournalSurface Science
Volume372
Pagination312-322
Date PublishedFeb
Type of ArticleArticle
ISBN Number0039-6028
Keywordschemisorption, ENERGY ELECTRON-DIFFRACTION, HETEROCYCLIZATION SITES, low energy electron diffraction, low index single crystal surface, METAL-SURFACES, microscopy, PHOSPHORUS, rhodium, SULFIDED PD(111) SURFACE, SURFACE RELAXATION AND RECONSTRUCTION, TENSOR LEED
Abstract

A recent communication [11] reported a novel structure for the (root 7 x root 7)R19.1 degrees reconstruction formed by P on the Rh(111) surface, and the present paper details the associated tensor LEED analysis. This reconstruction involves a packed arrangement of Rh pentagons and triangles for the topmost layer, with P atoms at 3/7 monolayer coverage occupying eight-coordinate sites created by the Rh pentagons. The nearly flat, densely packed Rh-P mixed layer (density of five Rh and three P atoms per seven Rh atoms in the substrate unit mesh) appears to provide a major stabilizing effect on this surface. The average P-Rh bond distance is indicated to be 2.52 Angstrom, slightly longer than that (2.38 A) in bulk Rh2P where the P atoms are also eight-coordinate. Some similarities are noted with the corresponding (rv (7) over bar x root 7)R19.1 degrees structures formed by S on the Pd(111), Cu(111) and Ag(111) surfaces.

URL<Go to ISI>://A1997WF20700043