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Measuring the silion fluoride bond distance in zeolites

TitleMeasuring the silion fluoride bond distance in zeolites
Publication TypeBook Chapter
Year of Publication2004
AuthorsDarton, RJ, Brouwer, DH, Fyfe, CA, Villaescusa, LA, Morris, RE
EditorVanSteen, E, Claeys, M, Callanan, LH
Book TitleRecent Advances in the Science and Technology of Zeolites and Related Materials, Pts a - C
Series TitleStudies in Surface Science and Catalysis
Volume154
Pagination1319-1323
PublisherElsevier Science Bv
CityAmsterdam
ISBN Number0167-29910-444-51805-3
Keywords5-COORDINATE SILICON, COMPLEX, IFR, IONS, LOCATION, MEDIA, MOLECULAR-SIEVES, SOLID-STATE NMR, STF, TEMPLATE
Abstract

A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction.

URL<Go to ISI>://000227357201022