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X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES WITH A BIAS-POTENTIAL METHOD FOR STUDYING SILANE ALUMINUM INTERFACES

TitleX-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES WITH A BIAS-POTENTIAL METHOD FOR STUDYING SILANE ALUMINUM INTERFACES
Publication TypeJournal Article
Year of Publication1993
AuthorsLeung, YL, Yang, YP, Wong, PC, Mitchell, KAR, Foster, T
JournalJournal of Materials Science Letters
Volume12
Pagination844-846
Date PublishedJun
Type of ArticleArticle
ISBN Number0261-8028
KeywordsSURFACES, THIN-FILMS, XPS
URL<Go to ISI>://A1993LH25400024