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XPS studies for an iron-zirconium interface in an oxidizing environment

TitleXPS studies for an iron-zirconium interface in an oxidizing environment
Publication TypeJournal Article
Year of Publication1995
AuthorsLi, YS, Liu, W, Wong, PC, Mitchell, KAR
JournalSurface Review and Letters
Volume2
Pagination759-763
Date PublishedDec
Type of ArticleArticle
ISBN Number0218-625X
KeywordsDIFFUSION, THIN-FILMS, WT-PERCENT NB
Abstract

A bimetallic film of iron and zirconium (thicknesses about 17 and 52 Angstrom respectively) was deposited on a gold substrate and studied by XPS after exposing to O-2 (approximately 10(3) L) at room temperature, and then heating at progressively higher temperatures up to 400 degrees C. An iron-oxide/iron/zirconium-oxide sandwich structure is present after the room-temperature exposure to O-2, and this work shows the ready transfer of O from the iron side to the zirconium side of the Fe/Zr interface. Fe migration also occurs at 220 degrees C and above, while by 300 degrees C this diffusion appears to cause a substantial restructuring of the ZrO2 layer.

URL<Go to ISI>://A1995TP61400007