@inbook {833,
	title = {Measuring the silion fluoride bond distance in zeolites},
	booktitle = {Recent Advances in the Science and Technology of Zeolites and Related Materials, Pts a - C},
	series = {Studies in Surface Science and Catalysis},
	volume = {154},
	year = {2004},
	note = {ISI Document Delivery No.: BBR47Times Cited: 0Cited Reference Count: 19Proceedings Paper14th International Zeolite Conference on Recent Advances in the Science and Technology of Zeolites and Related MaterialsAPR 25-30, 2004Cape Town, SOUTH AFRICASARA BURGERHARTSTRAAT 25, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS},
	pages = {1319-1323},
	publisher = {Elsevier Science Bv},
	organization = {Elsevier Science Bv},
	address = {Amsterdam},
	abstract = {A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction.},
	keywords = {5-COORDINATE SILICON, COMPLEX, IFR, IONS, LOCATION, MEDIA, MOLECULAR-SIEVES, SOLID-STATE NMR, STF, TEMPLATE},
	isbn = {0167-29910-444-51805-3},
	url = {<Go to ISI>://000227357201022},
	author = {Darton, R. J. and Brouwer, D. H. and Fyfe, C. A. and Villaescusa, L. A. and Morris, R. E.},
	editor = {VanSteen, E. and Claeys, M. and Callanan, L. H.}
}
