@article {3424,
	title = {XPS studies for an iron-zirconium interface in an oxidizing environment},
	journal = {Surface Review and Letters},
	volume = {2},
	number = {6},
	year = {1995},
	note = {ISI Document Delivery No.: TP614Times Cited: 2Cited Reference Count: 11},
	month = {Dec},
	pages = {759-763},
	type = {Article},
	abstract = {A bimetallic film of iron and zirconium (thicknesses about 17 and 52 Angstrom respectively) was deposited on a gold substrate and studied by XPS after exposing to O-2 (approximately 10(3) L) at room temperature, and then heating at progressively higher temperatures up to 400 degrees C. An iron-oxide/iron/zirconium-oxide sandwich structure is present after the room-temperature exposure to O-2, and this work shows the ready transfer of O from the iron side to the zirconium side of the Fe/Zr interface. Fe migration also occurs at 220 degrees C and above, while by 300 degrees C this diffusion appears to cause a substantial restructuring of the ZrO2 layer.},
	keywords = {DIFFUSION, THIN-FILMS, WT-PERCENT NB},
	isbn = {0218-625X},
	url = {<Go to ISI>://A1995TP61400007},
	author = {Li, Y. S. and Liu, W. and Wong, P. C. and Mitchell, K. A. R.}
}
