@article {450,
	title = {Structural investigation of Silicalite-I loaded with n-hexane by X-ray diffraction, Si-29 MAS NMR, and molecular modeling},
	journal = {Chemistry of Materials},
	volume = {14},
	number = {5},
	year = {2002},
	note = {ISI Document Delivery No.: 555JCTimes Cited: 23Cited Reference Count: 25},
	month = {May},
	pages = {2192-2198},
	type = {Article},
	abstract = {{The room temperature (298 K) structure of zeolite Silicalite-I loaded with approximately eight n-hexane molecules per unit cell was solved from twinned single-crystal X-ray diffraction (XRD) data in the monoclinic space group P12(1)/n1 with a = 19.8247(2) Angstrom},
	keywords = {ADSORPTION, ALKANES, ENERGY-MINIMIZATION CALCULATIONS, LOCALIZATION, NAPHTHALENE, ORTHORHOMBIC FRAMEWORK, POWDER DIFFRACTION, SIMULATIONS, ZEOLITE H-ZSM-5, ZSM-5},
	isbn = {0897-4756},
	url = {<Go to ISI>://000175790100041},
	author = {Morell, H. and Angermund, K. and Lewis, A. R. and Brouwer, D. H. and Fyfe, C. A. and Gies, H.}
}
@article {4274,
	title = {New structures - new insights: Progress in structure analysis of nanoporous materials},
	journal = {Microporous and Mesoporous Materials},
	volume = {21},
	number = {4-6},
	year = {1998},
	note = {ISI Document Delivery No.: 116MWTimes Cited: 24Cited Reference Count: 33International Symposium on Zeolites and Microporous Crystals (ZMPC 97)AUG 24-27, 1997TOKYO, JAPANWaseda Univ, Kanto Dist Council Catalysis Soc Japan},
	month = {May},
	pages = {183-197},
	type = {Proceedings Paper},
	abstract = {In the recent past structure determination of microporous materials has experienced considerable developments in methodology. The FOCUS method: high resolution powder diffraction data used for direct method structure solution in combination with crystal chemistry based modelling. The models are retrieved from electron density maps calculated in direct method runs, energy minimized and checked through for realistic angles and distances values. The SUM-TF method: diffraction patterns at moderate resolution analysed with direct methods using a modified tangent formula which includes Patterson information for the structure solving. In this way the atomic resolution criterion for direct methods is bypassed. This overview gives a summary of the structures successfully solved using these new techniques. (C) 1998 Elsevier Science B.V. All rights reserved.},
	keywords = {CRYSTAL-STRUCTURE, kanemite, LAYER SILICATE, layer silicates, PATTERSON-FUNCTION ARGUMENTS, POWDER DIFFRACTION, POWDER DIFFRACTION DATA, REFLECTIONS, RESOLUTION, Rietveld analysis, RUB-15, RUB-18, structure solution, TANGENT FORMULA, VNI, zeolite, zeolites},
	isbn = {1387-1811},
	url = {<Go to ISI>://000075730000003},
	author = {Gies, H. and Marler, B. and Vortmann, S. and Oberhagemann, U. and Bayat, P. and Krink, K. and Rius, J. and Wolf, I. and Fyfe, C.}
}
