@article {4062,
	title = {LEED crystallographic analysis for the Rh(111)-(root 7x root 7)R19.1 degrees-P surface structure},
	journal = {Surface Science},
	volume = {372},
	number = {1-3},
	year = {1997},
	note = {ISI Document Delivery No.: WF207Times Cited: 7Cited Reference Count: 32},
	month = {Feb},
	pages = {312-322},
	type = {Article},
	abstract = {A recent communication [11] reported a novel structure for the (root 7 x root 7)R19.1 degrees reconstruction formed by P on the Rh(111) surface, and the present paper details the associated tensor LEED analysis. This reconstruction involves a packed arrangement of Rh pentagons and triangles for the topmost layer, with P atoms at 3/7 monolayer coverage occupying eight-coordinate sites created by the Rh pentagons. The nearly flat, densely packed Rh-P mixed layer (density of five Rh and three P atoms per seven Rh atoms in the substrate unit mesh) appears to provide a major stabilizing effect on this surface. The average P-Rh bond distance is indicated to be 2.52 Angstrom, slightly longer than that (2.38 A) in bulk Rh2P where the P atoms are also eight-coordinate. Some similarities are noted with the corresponding (rv (7) over bar x root 7)R19.1 degrees structures formed by S on the Pd(111), Cu(111) and Ag(111) surfaces.},
	keywords = {chemisorption, ENERGY ELECTRON-DIFFRACTION, HETEROCYCLIZATION SITES, low energy electron diffraction, low index single crystal surface, METAL-SURFACES, microscopy, PHOSPHORUS, rhodium, SULFIDED PD(111) SURFACE, SURFACE RELAXATION AND RECONSTRUCTION, TENSOR LEED},
	isbn = {0039-6028},
	url = {<Go to ISI>://A1997WF20700043},
	author = {Liu, W. and Wong, K. C. and Mitchell, K. A. R.}
}
@article {4151,
	title = {LEED crystallographic analysis for the structure formed by 2 ML of O at the Zr(0001) surface},
	journal = {Surface Science},
	volume = {380},
	number = {2-3},
	year = {1997},
	note = {ISI Document Delivery No.: XF843Times Cited: 17Cited Reference Count: 29},
	month = {May},
	pages = {540-547},
	type = {Article},
	abstract = {A tensor LEED analysis is reported for the Zr(0001)-(1 x 1)-O surface which involves oxygen at a total coverage of 2 monolayers. The structure is indicated to have two layers of O: one forms an overlayer in which the O atoms bond to hollow sites of three-fold coordination on the regular metal surface. while the other laver has the O atoms in tetrahedral hole sires between the first and second metal layers. The stacking sequence, designated as (C)B(A)AB, corresponds to the first three layers of anion-terminated cubic ZrO2, although some lateral compression is needed for superposition on the regular hcp Zr structure. The absorption of O in the tetrahedral holes results in a significant expansion in the first-to-second Zr-Zr interlayer spacing to about 3.44 Angstrom from the bulk vaue of 2.57 Angstrom. The O-Zr bond lengths are estimated to equal 2.07 Angstrom for the overlayer O atoms, and 2.21 Angstrom for the O atoms in tetrahedral hole sites, Comparisons are made with the structures of the corresponding 0.5 and 1 ML surfaces formed by the O/Zr(0001) system. (C) 1997 Elsevier Science B.V.},
	keywords = {ENERGY-ELECTRON-DIFFRACTION, GROWTH, LEED crystallography, low index single crystal surface, OXIDE THIN-FILMS, OXYGEN, SINGLE-CRYSTAL SURFACES, STRUCTURE, SURFACE, ZIRCONIUM},
	isbn = {0039-6028},
	url = {<Go to ISI>://A1997XF84300044},
	author = {Wang, Y. M. and Li, Y. S. and Mitchell, K. A. R.}
}
