Performance Features
- Au and C60 analytical ion sources for enhanced ion yields and sensitivity
- 2D and 3D imaging characterization
- Capable of large mass range (10,000 amu) and high sensitivity (down to ppb level)
- Parallel detection of all secondary ions by the time-of-flight analyzer
- Charge neutralization using a pulsed electron and low energy Ar ion beam allows analysis and depth profiling of highly insulating sample
- Motorized sample stage with heating and cooling capability
- Interface with Leica MED 020 Cryogenic Sample Preparation System
Typical Analytical Applications
- Analysis of conducting, semiconducting and insulating solids
- Identification of high mass molecular fragments
- Capable of detecting all elements and isotopes with ppb sensitivity
- Depth profiling from a few nanometers to several microns deep