| Title | X-RAY PHOTOELECTRON SPECTROSCOPIC STUDIES WITH A BIAS-POTENTIAL METHOD FOR STUDYING SILANE ALUMINUM INTERFACES |
| Publication Type | Journal Article |
| Year of Publication | 1993 |
| Authors | Leung, YL, Yang, YP, Wong, PC, Mitchell, KAR, Foster, T |
| Journal | Journal of Materials Science Letters |
| Volume | 12 |
| Pagination | 844-846 |
| Date Published | Jun |
| Type of Article | Article |
| ISBN Number | 0261-8028 |
| Keywords | SURFACES, THIN-FILMS, XPS |
| URL | <Go to ISI>://A1993LH25400024 |
