| Title | Measuring the silion fluoride bond distance in zeolites |
| Publication Type | Book Chapter |
| Year of Publication | 2004 |
| Authors | Darton, RJ, Brouwer, DH, Fyfe, CA, Villaescusa, LA, Morris, RE |
| Editor | VanSteen, E, Claeys, M, Callanan, LH |
| Book Title | Recent Advances in the Science and Technology of Zeolites and Related Materials, Pts a - C |
| Series Title | Studies in Surface Science and Catalysis |
| Volume | 154 |
| Pagination | 1319-1323 |
| Publisher | Elsevier Science Bv |
| City | Amsterdam |
| ISBN Number | 0167-29910-444-51805-3 |
| Keywords | 5-COORDINATE SILICON, COMPLEX, IFR, IONS, LOCATION, MEDIA, MOLECULAR-SIEVES, SOLID-STATE NMR, STF, TEMPLATE |
| Abstract | A common misconception is that X-ray diffraction is the best way to measure bond distances. However, in some cases where disorder is present it can yield incorrect answers. The silicon-fluoride bond distance in fluoride-containing zeolite SFF has been measured using two magic angle spinning NMR techniques. Both techniques, variable contact time cross polarization and spinning side hand intensity fitting give shorter Si-F bond distances than X-ray diffraction. |
| URL | <Go to ISI>://000227357201022 |
